Paper Title:
Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 414-415)
Edited by
J. Gyulai
Pages
229-234
DOI
10.4028/www.scientific.net/MSF.414-415.229
Citation
J. Gubicza, I. C. Dragomir, G. Ribárik, Y. T. Zhu, R. Valiev, T. Ungár, "Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis", Materials Science Forum, Vols. 414-415, pp. 229-234, 2003
Online since
January 2003
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Yuri Estrin, Ralph Jörg Hellmig, Hyoung Seop Kim
29
Authors: Nathalie Audebrand, Daniel Louër
Abstract:The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection ...
71
Authors: Jenő Gubicza, Magdy Kassem, Tamás Ungár
Abstract:The effect of the nominal Mg content and the milling time on the microstructure of mechanically alloyed Al(Mg) solid solutions is...
103
Authors: J.L. Collet, Françoise Bley, Alexis Deschamps, Colin Scott
Abstract:The deformation mechanisms of an Fe-Mn-C TWIP steel have been investigated as a function of deformation and deformation temperature, using...
822
Authors: J.M. González, José A. Rodríguez, Enrique J. Herrera
Abstract:Nickel powder was dry-milled using a high-energy disc-oscillating mill. The average particle size increases and the specific surface area...
468