Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis |
| Journal |
Materials Science Forum (Volumes 414 - 415) |
| Volume |
Materials Science, Testing and Informatics I |
| Edited by |
J. Gyulai |
| Pages |
229-234 |
| DOI |
10.4028/www.scientific.net/MSF.414-415.229 |
| Citation |
Jenő Gubicza et al., 2003, Materials Science Forum, 414-415, 229 |
| Online since |
January, 2003 |
| Authors |
Jenő Gubicza, Iuliana C. Dragomir, Gábor Ribárik, Yuntian T. Zhu, Ruslan Z. Valiev, Tamás Ungár |
| Keywords |
Crystallite Size Distribution, Dislocation Structure, Plastic Deformation, Titanium (Ti), X-Ray Peak Profile Analysis |
| Full Paper |
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