Paper Title:
Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis
| Periodical | Materials Science Forum (Volumes 414 - 415) |
|---|---|
| Main Theme | Materials Science, Testing and Informatics I |
| Edited by | J. Gyulai |
| Pages | 229-234 |
| DOI | 10.4028/www.scientific.net/MSF.414-415.229 |
| Citation | Jenő Gubicza et al., 2003, Materials Science Forum, 414-415, 229 |
| Online since | January, 2003 |
| Authors | Jenő Gubicza, Iuliana C. Dragomir, Gábor Ribárik, Yuntian T. Zhu, Ruslan Valiev, Tamás Ungár |
| Keywords | Crystallite Size Distribution, Dislocation Structure, Plastic Deformation, Titanium (Ti), X-Ray Peak Profile Analysis |
| Price | US$ 28,- |
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