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The Applicability of Conventional Fiber Texture Analysis Techniques in Electron Backscatter Diffraction

Journal Materials Science Forum (Volumes 426 - 432)
Volume THERMEC'2003
Edited by T. Candra, Jose Maria Torralba and T. Sakai
Pages 3685-3690
DOI 10.4028/www.scientific.net/MSF.426-432.3685
Citation Stuart I. Wright et al., 2003, Materials Science Forum, 426-432, 3685
Online since August, 2003
Authors Stuart I. Wright, David P. Field, Matthew M. Nowell
Keywords Electron Backscatter Diffraction (EBSD), Orientation Image Microscopy (OIM), Orientation Imaging Microscopy, Texture
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