Paper Title:
X-Ray Microbeam Strain Measurements in Polycrystalline Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 426-432)
Main Theme
Edited by
T. Candra, Jose Maria Torralba and T. Sakai
Pages
3945-3950
DOI
10.4028/www.scientific.net/MSF.426-432.3945
Citation
G.S. Cargill III, L. Moyer, W. Yang, B.C. Larson, G. E. Ice, "X-Ray Microbeam Strain Measurements in Polycrystalline Films", Materials Science Forum, Vols. 426-432, pp. 3945-3950, 2003
Online since
August 2003
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.