Paper Title:
High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
289-292
DOI
10.4028/www.scientific.net/MSF.433-436.289
Citation
C. Seitz, A. Rempel, A. Magerl, M. Gomm, W. Sprengel, H. E. Schaefer, "High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals", Materials Science Forum, Vols. 433-436, pp. 289-292, 2003
Online since
September 2003
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