Paper Title:
Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
317-320
DOI
10.4028/www.scientific.net/MSF.433-436.317
Citation
S. Binetti, A. Le Donne, M. Acciarri, M. Cerminara, S. Pizzini, "Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy", Materials Science Forum, Vols. 433-436, pp. 317-320, 2003
Online since
September 2003
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