Paper Title:

Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy

Periodical Materials Science Forum (Volumes 433 - 436)
Main Theme Silicon Carbide and Related Materials - 2002
Edited by Peder Bergman and Erik Janzén
Pages 317-320
DOI 10.4028/www.scientific.net/MSF.433-436.317
Citation Simona Binetti et al., 2003, Materials Science Forum, 433-436, 317
Online since September, 2003
Authors Simona Binetti, Alessia Le Donne, Maurizio Acciarri, M. Cerminara, Sergio Pizzini
Keywords Atomic Force Microscope (AFM), Extended Defects, LBIC, Micropipe, Photoluminescence Spectroscopy
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