Paper Title:
Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
| Periodical |
Materials Science Forum (Volumes 433 - 436)
|
| Main Theme |
Silicon Carbide and Related Materials - 2002
|
| Edited by |
Peder Bergman and Erik Janzén |
| Pages |
317-320 |
| DOI |
10.4028/www.scientific.net/MSF.433-436.317 |
| Citation |
Simona Binetti et al., 2003, Materials Science Forum, 433-436, 317 |
| Online since |
September, 2003 |
| Authors |
Simona Binetti, Alessia Le Donne, Maurizio Acciarri, M. Cerminara, Sergio Pizzini |
| Keywords |
Atomic Force Microscope (AFM), Extended Defects, LBIC, Micropipe, Photoluminescence Spectroscopy |
| Price |
US$ 28,- |