Paper Title:

Raman Excitation Profiles of 3C-, 4H-, 6H-, 15R- and 21R-SiC

Periodical Materials Science Forum (Volumes 433 - 436)
Main Theme Silicon Carbide and Related Materials - 2002
Edited by Peder Bergman and Erik Janzén
Pages 325-328
DOI 10.4028/www.scientific.net/MSF.433-436.325
Citation Roland Püsche et al., 2003, Materials Science Forum, 433-436, 325
Online since September, 2003
Authors Roland Püsche, Martin Hundhausen, Lothar Ley
Keywords Excitation Profiles, Hexagonality, Polytype, Raman Spectroscopy
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