Paper Title:
Raman Excitation Profiles of 3C-, 4H-, 6H-, 15R- and 21R-SiC
| Periodical |
Materials Science Forum (Volumes 433 - 436)
|
| Main Theme |
Silicon Carbide and Related Materials - 2002
|
| Edited by |
Peder Bergman and Erik Janzén |
| Pages |
325-328 |
| DOI |
10.4028/www.scientific.net/MSF.433-436.325 |
| Citation |
Roland Püsche et al., 2003, Materials Science Forum, 433-436, 325 |
| Online since |
September, 2003 |
| Authors |
Roland Püsche, Martin Hundhausen, Lothar Ley |
| Keywords |
Excitation Profiles, Hexagonality, Polytype, Raman Spectroscopy |
| Price |
US$ 28,- |