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HTCVD Grown Semi-Insulating SiC Substrates

Journal Materials Science Forum (Volumes 433 - 436)
Volume Silicon Carbide and Related Materials - 2002
Edited by Peder Bergman and Erik Janzén
Pages 33-38
DOI 10.4028/www.scientific.net/MSF.433-436.33
Citation Alexsandre Ellison et al., 2003, Materials Science Forum, 433-436, 33
Online since September, 2003
Authors Alexsandre Ellison, Björn Magnusson, Nguyen Tien Son, L. Storasta, Erik Janzén
Keywords HTCVD Growth, Intrinsic Defect, Micropipe Closing, Purity, Semi-Insulating Substrate
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