Paper Title:
From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks
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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
403-406
DOI
10.4028/www.scientific.net/MSF.433-436.403
Citation
J. Pernot, J. Camassel, H. Peyre, J.-L. Robert, "From Transport Measurements to Infrared Reflectance Spectra of n-Type Doped 4H-SiC Layer Stacks", Materials Science Forum, Vols. 433-436, pp. 403-406, 2003
Online since
September 2003
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