Paper Title:
Electron-Induced Damage Effects in 4H-SiC Schottky Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
439-442
DOI
10.4028/www.scientific.net/MSF.433-436.439
Citation
A. Castaldini, A. Cavallini, F. Nava, P.G. Fuochi, P. Vanni, "Electron-Induced Damage Effects in 4H-SiC Schottky Diodes", Materials Science Forum, Vols. 433-436, pp. 439-442, 2003
Online since
September 2003
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