Defects in Semi-Insulating SiC Substrates |
| Journal |
Materials Science Forum (Volumes 433 - 436) |
| Volume |
Silicon Carbide and Related Materials - 2002 |
| Edited by |
Peder Bergman and Erik Janzén |
| Pages |
45-50 |
| DOI |
10.4028/www.scientific.net/MSF.433-436.45 |
| Citation |
Nguyen Tien Son et al., 2003, Materials Science Forum, 433-436, 45 |
| Online since |
September, 2003 |
| Authors |
Nguyen Tien Son, Björn Magnusson, Z. Zolnai, Alexsandre Ellison, Erik Janzén |
| Keywords |
Impurities, Intrinsic Defect, Magnetic Resonance, Resistivity, Semi-insulating (SI), Thermal Annealing |
| Full Paper |
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