Paper Title:
Angle-Resolved Studies of SiO2/SiC Samples
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
539-542
DOI
10.4028/www.scientific.net/MSF.433-436.539
Citation
L. I. Johansson, C. Virojanadara, T. Eickhoff, W. Drube, "Angle-Resolved Studies of SiO2/SiC Samples", Materials Science Forum, Vols. 433-436, pp. 539-542, 2003
Online since
September 2003
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