Paper Title:
Traps at the Interface of 3C-SiC/SiO2-MOS-Structures
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
551-554
DOI
10.4028/www.scientific.net/MSF.433-436.551
Citation
F. Ciobanu, G. Pensl, H. Nagasawa, A. Schöner, S. Dimitrijev, K.Y. Cheong, V. V. Afanas'ev, G. Wagner, "Traps at the Interface of 3C-SiC/SiO2-MOS-Structures", Materials Science Forum, Vols. 433-436, pp. 551-554, 2003
Online since
September 2003
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