Paper Title:
Structural Defects at SiO2/SiC Interfaces Detected by Positron Annihilation
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
559-562
DOI
10.4028/www.scientific.net/MSF.433-436.559
Citation
M. Maekawa, A. Kawasuso, M. Yoshikawa, H. Itoh, "Structural Defects at SiO2/SiC Interfaces Detected by Positron Annihilation", Materials Science Forum, Vols. 433-436, pp. 559-562, 2003
Online since
September 2003
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