Paper Title:
Electrical Characterization of Ion-Implanted n+/p 6H-SiC Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
621-624
DOI
10.4028/www.scientific.net/MSF.433-436.621
Citation
A. Poggi, R. Nipoti, G.C. Cardinali, F. Moscatelli, "Electrical Characterization of Ion-Implanted n+/p 6H-SiC Diodes", Materials Science Forum, Vols. 433-436, pp. 621-624, 2003
Online since
September 2003
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$32.00
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