Paper Title:
Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN
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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
677-680
DOI
10.4028/www.scientific.net/MSF.433-436.677
Citation
N. Tanuma, H. Tanizaki, S. Yokokura, T. Matsui, S. Hashiguchi , J. Sikula, M. Tacano, "Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN", Materials Science Forum, Vols. 433-436, pp. 677-680, 2003
Online since
September 2003
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