Paper Title:
Simulation and Measurement of Switching Characteristics of 4H-SiC Buried-Gate JFETs
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
773-776
DOI
10.4028/www.scientific.net/MSF.433-436.773
Citation
S.-M. Koo, M. Domeij, C. M. Zetterling, M. Östling, U. Forsberg, E. Janzén, "Simulation and Measurement of Switching Characteristics of 4H-SiC Buried-Gate JFETs", Materials Science Forum, Vols. 433-436, pp. 773-776, 2003
Online since
September 2003
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