Paper Title:
Defect Reduction in SiC Crystals Grown by the Modified Lely Method
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
83-86
DOI
10.4028/www.scientific.net/MSF.433-436.83
Citation
M. Anikin, M. Pons, E. Pernot, R. Madar, "Defect Reduction in SiC Crystals Grown by the Modified Lely Method", Materials Science Forum, Vols. 433-436, pp. 83-86, 2003
Online since
September 2003
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