Paper Title:
Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes
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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
913-916
DOI
10.4028/www.scientific.net/MSF.433-436.913
Citation
H. Jacobsson, P. Bergman, C. Hallin, T.O. Tuomi, E. Janzén, "Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes ", Materials Science Forum, Vols. 433-436, pp. 913-916, 2003
Online since
September 2003
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