Paper Title:
Impact of SiC Structural Defects on the Degradation Phenomenon of Bipolar SiC Devices
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
917-920
DOI
10.4028/www.scientific.net/MSF.433-436.917
Citation
R. K. Malhan, H. Nakamura, S. Onda, D. Nakamura, K. Hara, "Impact of SiC Structural Defects on the Degradation Phenomenon of Bipolar SiC Devices", Materials Science Forum, Vols. 433-436, pp. 917-920, 2003
Online since
September 2003
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Price
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