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European Powder Diffraction EPDIC 8

Materials Science Forum Volumes 443 - 444

• Papers
• Abstracts

• p1 Grain Surface Relaxation and Grain Interaction in Powder Diffraction   [ 523 K ]
  Authors: Matteo Leoni
• p11 Fundamental Developments in Direct-Space Techniques for Structure Solution from Powder Diffraction Data   [ 218 K ]
  Authors: Scott Habershon, David Albesa-Jové, Eugene Y. Cheung, Giles W. Turner, Roy L. Johnston, Kenneth D.M. Harris
• p23 Completion of Crystal Structure with Polyhedral Coordination: A New Procedure   [ 148 K ]
  Authors: Angela Altomare, Corrado Cuocci, Carmelo Giacovazzo, Anna Grazia, Anna Grazia Giuseppina Moliterni, Rosanna Rizzi
• p27 Calibration of Diffractometers: A Test Method to Monitor the Performance of Instruments   [ 149 K ]
  Authors: Giovanni Berti, U. Bartoli, M. D'Acunto, F. De Marco
• p31 Standardisation of X-Ray Powder Diffraction Methods   [ 133 K ]
  Authors: Giovanni Berti, Rob Delhez, S. Norval, B. Peplinski, E. Tolle, J. Verollet
• p35 FOX: Modular Approach to Crystal Structure Determination from Powder Diffraction   [ 165 K ]
  Authors: V. Favre-Nicolin, R. Černý
• p39 X-Ray Powder Diffraction Study of Atomic Structure of Nanocrystalline SiC and Diamond Materials   [ 345 K ]
  Authors: Ewa Grzanka, Bogdan F. Palosz, Stanislaw Gierlotka, Svetlana Stelmakh, Roman Pielaszek, Ulrich Bismayer, J. Neuefeind, P. Jóvári, W. Palosz
• p45 Quantitative Phase Analysis Using the Rietveld Method - Estimates of Possible Problems Based on Two Interlaboratory Comparisons   [ 201 K ]
  Authors: B. Peplinski, R. Kleeberg, J. Bergmann, J. Wenzel
• p51 Planar Disorder Analysis from Powder Diffraction Pattern
  Authors: E. Estevez-Rams, R. Lora, A. Penton, B. Aragon-Fernandez, Hartmut Fuess
• p55 New Method for Estimation of the Magnesium Fraction in Magnesian Calcite   [ 153 K ]
  Authors: B. Gržeta, D. Medaković, S. Popović
• p59 XRD Study of the Nacrite/CsCl/H₂O Intercalation Complex   [ 186 K ]
  Authors: S. Naamen, H. Ben Rhaiem, A. Ben Haj Amara
• p65 X-Ray Scattering from Thin Films and Multilayers   [ 525 K ]
  Authors: David Rafaja
• p71 The Microstructure of Nanocrystalline Powders from Line Profile Analysis   [ 272 K ]
  Authors: Nathalie Audebrand, Daniel Louër
• p77 Elastic Behaviour of Thin Stabilized-Zirconia Coatings   [ 190 K ]
  Authors: Paolo Scardi, Matteo Leoni, M. Loch, G. Barbezat
• p83 Characterization of Crystalline Silicon via XRPD   [ 169 K ]
  Authors: Giovanni Berti, U. Bartoli, G. Basile, P. Becker, A.N. Fitch