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Grain Surface Relaxation and Grain Interaction in Powder Diffraction

Journal Materials Science Forum (Volumes 443 - 444)
Volume European Powder Diffraction EPDIC 8
Edited by Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel
Pages 1-10
DOI 10.4028/www.scientific.net/MSF.443-444.1
Citation Matteo Leoni, 2004, Materials Science Forum, 443-444, 1
Online since January, 2004
Authors Matteo Leoni
Keywords Grain Interaction, Grain Surface Relaxation, Nanocrystal, Residual Stress, X-Ray Diffraction (XRD)
Abstract

The role of grain surfaces and interfaces in nanocrystalline materials is investigated by X-ray diffraction (XRD). Two apparently distinct aspects show the importance of the interaction of a single grain with the environment in which it is placed: the role of grain-grain interaction in determining the residual stress in a polycrystalline thin film and the surface effects in single powder grains on the macroscopic average cell parameter determined by powder diffraction. A brief theoretical introduction of the phenomena and their possible modelling is presented together with a discussion of practical examples.

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