Grain Surface Relaxation and Grain Interaction in Powder Diffraction |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
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| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 1-10 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.1 |
| Citation | Matteo Leoni, 2004, Materials Science Forum, 443-444, 1 |
| Online since | January, 2004 |
| Authors | Matteo Leoni |
| Keywords | Grain Interaction, Grain Surface Relaxation, Nanocrystal, Residual Stress, X-Ray Diffraction (XRD) |
| Abstract | The role of grain surfaces and interfaces in nanocrystalline materials is investigated by X-ray diffraction (XRD). Two apparently distinct aspects show the importance of the interaction of a single grain with the environment in which it is placed: the role of grain-grain interaction in determining the residual stress in a polycrystalline thin film and the surface effects in single powder grains on the macroscopic average cell parameter determined by powder diffraction. A brief theoretical introduction of the phenomena and their possible modelling is presented together with a discussion of practical examples. |
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