Paper Title:
Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
  Abstract

Two methods were used for the analysis of submicro-crystalline copper prepared by high-pressure (6 GPa) severe plastic deformation. Conventional powder XRD study was carried in terms of the modified Williamson-Hall (WH) plots and shown large line-broadening anisotropy. A new high-resolution small-angle transmission diffuse scattering method was applied for determination of crystallite size. Two methods were used for the evaluation of the diffuse scattering - calculation of the autocorrelation function of the crystalline shape by the transformation of the measured signal and by the direct fitting. Bimodal block size distribution has to be assumed for annealed samples. This was also confirmed by classical back-reflection film method as well as by the long tails of conventional diffraction profiles.

  Info
Periodical
Materials Science Forum (Volumes 443-444)
Edited by
Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel
Pages
111-114
DOI
10.4028/www.scientific.net/MSF.443-444.111
Citation
R. Kužel, D. Šimek, J. Kub, R. K. Islamgaliev, "Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave", Materials Science Forum, Vols. 443-444, pp. 111-114, 2004
Online since
January 2004
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$32.00
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