Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
|---|---|
| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 123-126 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.123 |
| Citation | Juan Rodríquez-Carvajal et al., 2004, Materials Science Forum, 443-444, 123 |
| Online since | January, 2004 |
| Authors | Juan Rodríquez-Carvajal, T. Roisnel |
| Keywords | Instrumental Resolution Function, Line Broadening, Micro-Structural Properties, Voigt Function |
| Abstract | A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed. |
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