Performance Stability of Microfocusing Source and Multilayer Optics Based X-Ray Diffraction System |
|
| Journal | Materials Science Forum (Volumes 443 - 444) |
|---|---|
| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 159-162 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.159 |
| Citation | Bonglea Kim et al., 2004, Materials Science Forum, 443-444, 159 |
| Online since | January, 2004 |
| Authors | Bonglea Kim, Boris Verman, Licai Jiang |
| Keywords | Microfocusing X-RAY Source, Multilayer Optics, Performance Stability, Source Stability, Spot Lifetime, Temperature Stability |
| Abstract | X-ray diffraction systems based on a microfocusing X-ray source and multilayer side-by-side optics are suitable for X-ray diffraction studies in a variety of fields, such as protein crystallography, due to their compactness and low cost in maintenance. However, new problems can occur, such as intensity instability induced by source position drifting. Various investigations for the reasons and the consequences of the instability are presented in this paper. Feasible solutions and suggestions are given to obtain more stable system performance. |
| Full Paper | 
Get the full paper by clicking here
|
First page example
