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128-Channel Silicon Strip Detector Installed at a Powder Diffractometer

Journal Materials Science Forum (Volumes 443 - 444)
Volume European Powder Diffraction EPDIC 8
Edited by Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel
Pages 175-180
DOI 10.4028/www.scientific.net/MSF.443-444.175
Citation A. Zięba et al., 2004, Materials Science Forum, 443-444, 175
Online since January, 2004
Authors A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek
Keywords Multi-Layer, Position Sensitive Detector (PSD), Powder, Reciprocal Space, X-Ray Diffraction (XRD)
Abstract

Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker). Applications of the detector to diffraction measurements of single crystals and thin films are discussed briefly.

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