128-Channel Silicon Strip Detector Installed at a Powder Diffractometer |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
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| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 175-180 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.175 |
| Citation | A. Zięba et al., 2004, Materials Science Forum, 443-444, 175 |
| Online since | January, 2004 |
| Authors | A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek |
| Keywords | Multi-Layer, Position Sensitive Detector (PSD), Powder, Reciprocal Space, X-Ray Diffraction (XRD) |
| Abstract | Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker). Applications of the detector to diffraction measurements of single crystals and thin films are discussed briefly. |
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