Crystallographic texture is one of frequently investigated properties of near-surface regions. From the application point of view, the inheritance effect of the crystallographic orientation of a substrate is important for layered structures. The investigation of the texture of layered structures or gradient materials by means of X-ray diffraction back-reflection pole figure measurements requires a control of the information depth. Such measurements at a controlled information depth can be achieved by means of non-symmetrical diffraction geometry, employing a constant value of falling angle of the incident beam. Thus, the texture of near-surface layers with a defined thickness can be examined, as in tomographic techniques. In this work, the method of texture analysis based on a controlled information depth was applied to the investigation of the texture inheritance of a Zn protective layer on deep drawing steel. Moreover, the crystallographic relations between the texture of substrate and deposited layer, termed as texture inheritance, were considered.