X-Ray Scattering from Thin Films and Multilayers |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
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| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 65-70 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.65 |
| Citation | David Rafaja, 2004, Materials Science Forum, 443-444, 65 |
| Online since | January, 2004 |
| Authors | David Rafaja |
| Keywords | Functionally Graded Material (FGM), Glancing Angle X-Ray Diffraction (GAXRD), Low-Dimensional Structures, Small Angle X-Ray Scattering |
| Abstract | Capability of the X-ray scattering for study of low-dimensional structures is illustrated on few examples. They are focused to the phase analysis, residual stress measurement, calculation of the stress-free lattice parameters, investigation of the anisotropic lattice deformation and preferred orientation in UN thin films. Further, the study of concentration profiles in functionally graded hard-metals and investigation of the multilayer degradation caused by soft annealing are discussed. |
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