The Microstructure of Nanocrystalline Powders from Line Profile Analysis |
| Journal |
Materials Science Forum (Volumes 443 - 444) |
| Volume |
European Powder Diffraction EPDIC 8 |
| Edited by |
Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages |
71-76 |
| DOI |
10.4028/www.scientific.net/MSF.443-444.71 |
| Online since |
January, 2004 |
| Authors |
Nathalie Audebrand,
Daniel Louër
|
| Keywords |
Line Profile Analysis, Microstructure, Nanocrystalline Powder, Structure Imperfections, X-Ray Powder Diffraction |
| Abstract |
The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented. |
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