Simulation of X-Ray Powder Diffraction Patterns for One-Dimensionally Disordered Crystals |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
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| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 87-90 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.87 |
| Citation | S.V. Cherepanova et al., 2004, Materials Science Forum, 443-444, 87 |
| Online since | January, 2004 |
| Authors | S.V. Cherepanova, S.V. Tsybulya |
| Keywords | Defect, Simulation, X-Ray Powder Diffraction |
| Abstract | Software for the simulation of X-ray powder diffraction (XRPD) patterns for ultrafine-grained materials with some kinds of imperfections has been developed. These calculations are performed on the base of the model of one-dimensionally disordered (1D-disordered) crystal [1]. Such a model can describe stacking faults (SF) and other planar defects (PD) and also finite size of coherently scattering domains. Simulated XRPD pattern is compared with experimental one and can be fitted to it. Potentialities of the software are illustrated by several examples. |
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