Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation |
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| Journal | Materials Science Forum (Volumes 443 - 444) |
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| Volume | European Powder Diffraction EPDIC 8 |
| Edited by | Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel |
| Pages | 99-102 |
| DOI | 10.4028/www.scientific.net/MSF.443-444.99 |
| Citation | Nariman A. Enikeev et al., 2004, Materials Science Forum, 443-444, 99 |
| Online since | January, 2004 |
| Authors | Nariman A. Enikeev, Igor V. Alexandrov, Ruslan Z. Valiev |
| Keywords | Defect Structure, Grain Boundary Dislocation, Nanostructured Material, Severe Plastic Deformation (SPD), X-Ray Analysis |
| Abstract | A computer simulation-based approach has been developed in order to reveal grain boundary defect structure of nanomaterials, which is described in terms of extrinsic grain boundary dislocations. On the basis of comparative analysis of numerically obtained results to experimental data, the defect structure parameters of nanostructured materials produced by severe plastic deformation have been evaluated. |
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