Paper Title
Page
Authors: Marek Andrzej Kojdecki
Abstract:A polycrystalline material may be considered as a set of crystallites. Since the crystallites have rather regular shapes, the...
107
Authors: Radomír Kužel, D. Šimek, J. Kub, Rinat K. Islamgaliev
Abstract:Two methods were used for the analysis of submicro-crystalline copper prepared by high-pressure (6 GPa) severe plastic deformation....
111
Authors: J. Lhotka, Radomír Kužel, G. Cappuccio, V. Valvoda
Abstract:The thickness measurement based on absorption of X-rays in thin films has been tested on a polycrystalline titanium nitride ...
115
Authors: I. Lucks, P. Lamparter, Jian Xu, Eric J. Mittemeijer
Abstract:Palladium powder was deformed by ball milling under an argon atmosphere in two types of mills for different milling times. Two methods ...
119
Authors: Juan Rodríquez-Carvajal, T. Roisnel
Abstract:A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of ...
123
Authors: Arnold C. Vermeulen, Rob Delhez
Abstract:All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument ...
127
Authors: U. Welzel, Eric J. Mittemeijer
Abstract:The so-called crystallite group (CGM) method, employed for diffraction stress analysis, involves that a possibly complex texture is...
131
Authors: Leszek Tarkowski, L. Laskosz, Jan T. Bonarski
Abstract:The traditionally applied registration method of the back-reflection pole figure is based on the equiangular measurement lattice. It...
137
Authors: I. Tomov
Abstract:A method of pole density measurements is described, which uses the differences in X-ray beam polarisation of two monochromators. The ...
141
Authors: H. Toraya, H. Hibino, Takashi Ida
Abstract:A quantitative basis for rocking curve measurements of preferentially oriented polycrystalline thin films is presented. The...
145
Showing 21 to 30 of 89 Paper Titles