Paper Title:
Positron Beam Study of Defects Induced in Ar-Implanted Si
  Abstract

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Periodical
Materials Science Forum (Volumes 445-446)
Edited by
Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito
Pages
150-152
DOI
10.4028/www.scientific.net/MSF.445-446.150
Citation
T. Miyagoe, M. Fujinami, T. Sawada, R. Suzuki, T. Ohdaira, T. Akahane, "Positron Beam Study of Defects Induced in Ar-Implanted Si", Materials Science Forum, Vols. 445-446, pp. 150-152, 2004
Online since
January 2004
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