Paper Title:
Study on Grown-in Defects in CZ-Si by Positron Annihilation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 445-446)
Edited by
Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito
Pages
159-161
DOI
10.4028/www.scientific.net/MSF.445-446.159
Citation
S. Nakagawa, F. Hori, R. Oshima, "Study on Grown-in Defects in CZ-Si by Positron Annihilation", Materials Science Forum, Vols. 445-446, pp. 159-161, 2004
Online since
January 2004
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Price
$32.00
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