Paper Title:
Characterisation of Defects in Simulated Nanostructures
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 445-446)
Edited by
Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito
Pages
204-206
DOI
10.4028/www.scientific.net/MSF.445-446.204
Citation
S. Van Petegem, J. Kuriplach, H. Van Swygenhoven, R. Meyer, C. Dauwe, D. Segers, "Characterisation of Defects in Simulated Nanostructures", Materials Science Forum, Vols. 445-446, pp. 204-206, 2004
Online since
January 2004
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Price
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