Paper Title:
Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium
  Abstract

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Periodical
Materials Science Forum (Volumes 445-446)
Edited by
Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito
Pages
254-258
DOI
10.4028/www.scientific.net/MSF.445-446.254
Citation
A. van Veen, R. Escobar Galindo, S.W.H. Eijt, H. Schut, H. van Gog, A.R. Balkenende, F.K. De Theije, "Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium", Materials Science Forum, Vols. 445-446, pp. 254-258, 2004
Online since
January 2004
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$32.00
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