Paper Title:
Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
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Periodical
Materials Science Forum (Volumes 445-446)
Edited by
Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito
Pages
510-512
DOI
10.4028/www.scientific.net/MSF.445-446.510
Citation
T.E.M. Staab, C. Zamponi, M. Haaks, I. Müller, S. Eichler, K. Maier, "Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe", Materials Science Forum, Vols. 445-446, pp. 510-512, 2004
Online since
January 2004
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