Paper Title:
XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces
  Abstract

The adsorptive on pure iron and copper surfaces was investigated with angle resolved X-ray photoelectron spectroscopy (ARXPS) and atomic force microscope (AFM). Organic species and a little amount of water (micro-droplets surrounded with nanometer-scale film-like-domains) were detected on the oxidized and/or hydrated metallic surfaces for both specimens and their minute structures were discussed.

  Info
Periodical
Materials Science Forum (Volumes 449-452)
Edited by
S.-G. Kang and T. Kobayashi
Pages
1025-1028
DOI
10.4028/www.scientific.net/MSF.449-452.1025
Citation
R. G. Wang, M. Kido, F. Suzumura, "XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces", Materials Science Forum, Vols. 449-452, pp. 1025-1028, 2004
Online since
March 2004
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