Paper Title:
Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 449-452)
Edited by
S.-G. Kang and T. Kobayashi
Pages
445-448
DOI
10.4028/www.scientific.net/MSF.449-452.445
Citation
Y. Miura, M. Doi, T. Moritani, M. Takagi, T. Imura, Y. Masuo, "Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films", Materials Science Forum, Vols. 449-452, pp. 445-448, 2004
Online since
March 2004
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Price
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