Paper Title:
Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to III-Nitride Semiconductors
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Periodical
Materials Science Forum (Volumes 455-456)
Edited by
Rodrigo Martins, Elvira Fortunator, Isabel Ferreira, Carlos Dias
Pages
132-136
DOI
10.4028/www.scientific.net/MSF.455-456.132
Citation
N. Franco, S. Pereira, A.D. Sequeira, "Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to III-Nitride Semiconductors", Materials Science Forum, Vols. 455-456, pp. 132-136, 2004
Online since
May 2004
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