Paper Title:
In-Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films
  Abstract

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Periodical
Materials Science Forum (Volumes 455-456)
Edited by
Rodrigo Martins, Elvira Fortunator, Isabel Ferreira, Carlos Dias
Pages
342-345
DOI
10.4028/www.scientific.net/MSF.455-456.342
Citation
R. M. S. Martins, R. J. C. Silva, F. M. Braz Fernandes, L. Pereira, P. R. Gordo, M. J.P. Maneira, N. Schell, "In-Situ GIXRD Characterization of the Crystallization of Ni-Ti Sputtered Thin Films", Materials Science Forum, Vols. 455-456, pp. 342-345, 2004
Online since
May 2004
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