Paper Title:
Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1077-1080
DOI
10.4028/www.scientific.net/MSF.457-460.1077
Citation
Y. Ding, K.B. Park, J.P. Pelz, A.V. Los, M. S. Mazzola, "Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC", Materials Science Forum, Vols. 457-460, pp. 1077-1080, 2004
Online since
June 2004
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