Paper Title:
Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1081-1084
DOI
10.4028/www.scientific.net/MSF.457-460.1081
Citation
L. Scaltrito, E. Celasco, S. Porro, S. Ferrero, F. Giorgis, C. F. Pirri, D. Perrone, U. M. Meotto, P. Mandracci, G. Richieri, L. Merlin, A. Cavallini, A. Castaldini, M. Rossi, "Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes", Materials Science Forum, Vols. 457-460, pp. 1081-1084, 2004
Online since
June 2004
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