Paper Title:
RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1205-1208
DOI
10.4028/www.scientific.net/MSF.457-460.1205
Citation
S. Sriram, A. Ward, C. Janke, T.S. Alcorn, H. Hagleitner, J. Henning, K. Wieber, J. R. Jenny, J. J. Sumakeris, S.T. Allen, "RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates", Materials Science Forum, Vols. 457-460, pp. 1205-1208, 2004
Online since
June 2004
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