RF Performance and Reliability of SiC MESFETs on High Purity Semi-Insulating Substrates |
| Journal |
Materials Science Forum (Volumes 457 - 460) |
| Volume |
Silicon Carbide and Related Materials 2003 |
| Edited by |
Roland Madar, Jean Camassel and Elisabeth Blanquet |
| Pages |
1205-1208 |
| DOI |
10.4028/www.scientific.net/MSF.457-460.1205 |
| Citation |
Saptharishi Sriram et al., 2004, Materials Science Forum, 457-460, 1205 |
| Online since |
June, 2004 |
| Authors |
Saptharishi Sriram, A. Ward, C. Janke, T.S. Alcorn, H. Hagleitner, Jason Henning, K. Wieber, Jason R. Jenny, Joseph J. Sumakeris, S.T. Allen |
| Keywords |
MESFET, Reliability, RF Power, Silicon Carbide (SiC), Trapping |
| Full Paper |
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