Paper Title:
A Comparison between SiO2/4H-SiC Interface Traps on (0001) and (11-20) Faces
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1305-1308
DOI
10.4028/www.scientific.net/MSF.457-460.1305
Citation
H.Ö. Ólafsson, C. Hallin, E. Ö. Sveinbjörnsson, "A Comparison between SiO2/4H-SiC Interface Traps on (0001) and (11-20) Faces", Materials Science Forum, Vols. 457-460, pp. 1305-1308, 2004
Online since
June 2004
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