Paper Title:
Static and Dynamic Characterization of 20A, 600V SiC MOS-Enhanced JFET
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1389-1392
DOI
10.4028/www.scientific.net/MSF.457-460.1389
Citation
E. Hanna, H.R. Chang, A.V. Radun, Q. Zhang, M. Gomez, "Static and Dynamic Characterization of 20A, 600V SiC MOS-Enhanced JFET", Materials Science Forum, Vols. 457-460, pp. 1389-1392, 2004
Online since
June 2004
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Price
$32.00
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