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Effects of Ionicity on Defect Physics of Wide-Band-Gap Semiconductors

Journal Materials Science Forum (Volumes 457 - 460)
Volume Silicon Carbide and Related Materials 2003
Edited by Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages 15-20
DOI 10.4028/www.scientific.net/MSF.457-460.15
Online since June, 2004
Authors Chris G. Van de Walle
Keywords Compensation, Doping, First Principles Calculation, Impurities, Point Defect
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