Paper Title:
Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers
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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1503-1506
DOI
10.4028/www.scientific.net/MSF.457-460.1503
Citation
A. Le Donne, S. Binetti, M. Acciarri, A. Castaldini, F. Nava, A. Cavallini, S. Pizzini, "Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers ", Materials Science Forum, Vols. 457-460, pp. 1503-1506, 2004
Online since
June 2004
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