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Substrate Bias Amplification of a SiC Junction Field Effect Transistor with a Catalytic Gate Electrode

Journal Materials Science Forum (Volumes 457 - 460)
Volume Silicon Carbide and Related Materials 2003
Edited by Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages 1507-1510
DOI 10.4028/www.scientific.net/MSF.457-460.1507
Citation Shinji Nakagomi et al., 2004, Materials Science Forum, 457-460, 1507
Online since June, 2004
Authors Shinji Nakagomi, M. Takahashi, Y. Kokubun, Lars Unéus, Susan Savage, H. Wingbrant, Mike Andersson, Ingemar Lundström, M. Löfdahl, Anita Lloyd Spetz
Keywords Buried Channel, Catalytic Gate, Gas Sensor, High Temperature, JFET, SIT, Substrate Bias
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