Paper Title:
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1601-1604
DOI
10.4028/www.scientific.net/MSF.457-460.1601
Citation
B. Poust, P. Feichtinger, R. Sandhu, I.P. Smorchkova, B. Heying, T. Block, M. Wojtowicz, M.S. Goorsky, "X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC", Materials Science Forum, Vols. 457-460, pp. 1601-1604, 2004
Online since
June 2004
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