Paper Title:

X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

Periodical Materials Science Forum (Volumes 457 - 460)
Main Theme Silicon Carbide and Related Materials 2003
Edited by Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages 363-366
DOI 10.4028/www.scientific.net/MSF.457-460.363
Citation T.S. Argunova et al., 2004, Materials Science Forum, 457-460, 363
Online since June, 2004
Authors T.S. Argunova, Mikhail Yu. Gutkin, Jung Ho Je, L.M. Sorokin, G.N. Mosina, N.S. Savkina, V.B. Shuman, Alexander A. Lebedev
Keywords Micropipe, Porous SiC, Silicon Carbide (SiC), Synchrotron Imaging, TEM
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