Paper Title:
X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface
| Periodical |
Materials Science Forum (Volumes 457 - 460)
|
| Main Theme |
Silicon Carbide and Related Materials 2003
|
| Edited by |
Roland Madar, Jean Camassel and Elisabeth Blanquet |
| Pages |
363-366 |
| DOI |
10.4028/www.scientific.net/MSF.457-460.363 |
| Citation |
T.S. Argunova et al., 2004, Materials Science Forum, 457-460, 363 |
| Online since |
June, 2004 |
| Authors |
T.S. Argunova, Mikhail Yu. Gutkin, Jung Ho Je, L.M. Sorokin, G.N. Mosina, N.S. Savkina, V.B. Shuman, Alexander A. Lebedev |
| Keywords |
Micropipe, Porous SiC, Silicon Carbide (SiC), Synchrotron Imaging, TEM |
| Price |
US$ 28,- |