Paper Title:
X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface
  Abstract

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Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
363-366
DOI
10.4028/www.scientific.net/MSF.457-460.363
Citation
T.S. Argunova, M. Y. Gutkin, J. H. Je, L.M. Sorokin, G.N. Mosina, N.S. Savkina, V.B. Shuman, A. A. Lebedev, "X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface ", Materials Science Forum, Vols. 457-460, pp. 363-366, 2004
Online since
June 2004
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